New optoelectronic devices for the Near and Mid-Infrared spectral range open completely new possibilities for portable sensors creation. Using infrared LED-PD optopairs allows developing an instrument that is smaller, less expensive and energy-saving.
Plastic thickness measurement
Due to constant increase of plastic production and rise of quality requirements it becomes inevitable to use reliable and efficient quality control systems. Mid-infrared light-emitting diodes and photodiodes manufactured by LED Microsensor NT, LLC have already found their usefulness in a vast area of applications and have much to offer to plastic manufacturers.
Thickness measurement is based on the Beer’s law which states that intensity of transmitted light exponentially depends on thickness of material.
Thickness measurement is based on the Beer’s law which states that intensity of transmitted light exponentially depends on thickness of material.
Thickness measurement principle:
▪ UDK universal evaluation kit with modular design that includes:
- Light emitting diode Lms23LED or Lms34LED (other LED is available) with an LED driver
- Photodiode Lms24PD or Lms36PD (other PD is available) with a preamplifier
- SDM synchronous detector
- Any additional component(s) can be added by request
▪ NEW Lms-R minispectrometer is a new portable device for spectral express analysis in the near infrared (IR) range from 1.3 to 2.4 μm.